Sunday Short Course

AMTA 2016 Short Course
Sunday, October 30
9:00 am – 5:30 pm

New Frontiers in RF Material Measurements

Michael Havrilla
Air Force Institute of Technology, Dept of ECE, WPAFB, OH 45433
Lydell Frasch
Boeing Corporation, St. Louis, MO 63166
Peter Collins
Air Force Institute of Technology, Dept of ECE, WPAFB, OH 45433

The present authors taught a short course at AMTA 2010 on the fundamental concepts of electromagnetic material measurements. Since that time, profound advancements in manufacturing and technology, including their widespread availability (such as 3-D printing), have significantly altered the landscape of material and antenna measurements. The primary goal of this short course is to explain, exploit, and demonstrate these recent advances for the benefit of the measurement community.

Traditionally, electromagnetic material measurements have focused on the properties of simple (linear, homogeneous, isotropic) media, scattering parameters and calibration of two-port networks, and common material characterization fixtures. The goal of this short course is to first start with a very brief review of these fundamental measurement concepts followed by an extensive overview of how manufacturing and technological advancements have created new frontiers in material measurements, especially in regards to complex media (i.e., nonlinear, inhomogeneous, non-isotropic metamaterials) and environments.

This short course provides extensive analysis and discussion of how these new advancements are being utilized in the material and antenna measurement communities as well as applications. The primary advancements that are investigated in this short course include additive/subtractive manufacturing, rapid prototyping, robotics, high-performance computing, and multiport, high-frequency, portable, true stimulus and nonlinear vector network analyzers. A demonstration segment is provided to encourage a hands-on learning environment. This short course concludes with a discussion of future frontiers and challenges.

Course Outline

  • Introduction and Motivation
  • Fundamental Concepts of Material Measurements
    • Review of Materials
    • Material Measurement Applicators
    • Two-Port Network Analyzers and S-Parameters
    • Calibration
    • Measurement Best Practices
  • New Frontiers in Material Measurements
    • New Advancements in Manufacturing and Material Fabrication
      • Additive/Subtractive Manufacturing
      • 3D Scanners
      • Precision Robotic Arms
      • Affordable High Performance Computing Resources
    • New Advancements in Measurement Equipment
      • Multiport (N>2) Network Analyzers
        • Overview
        • S-Parameters for N-Port Linear Networks
        • Measurement and Calibration
        • E-Cal Kits
      • Multi-Source Network Analyzers
        • Overview
        • Mixed-Mode S-Parameters
      • Non-Linear Network Analyzers
        • Overview
        • Calibration
      • High Frequency Network Analyzers
        • Overview
        • High Frequency Modules
        • Challenges
      • Portable network Analyzers
    • New Technology-Inspired Materials and Measurement Techniques
      • Complex Media
        • Introduction to Complex Media
        • Applications and Devices
        • Influence of Symmetry on Material Properties
        • Tensor Structure
        • Design, Modeling and Fabrication of Complex Media
        • Electromagnetics of Complex Media
        • Complex Media Material Characterization and Calibration Techniques
      • High Temperature Material Characterization Techniques
        • Dual Chamber High Temperature Rectangular Waveguide
        • Dual High Temperature Stripline
      • Focused Beam Material Characterization with Quad Ridged Horn Antennas
      • Nonlinear Material Characterization
      • Antenna and RCS Measurement Using Robotic Arms
      • Computational Electromagnetic Material Characterization Techniques
    • Demonstrations
      • Biaxial Material Characterization Technique
      • Portable Measurements
      • Multiport Measurements
  • Future Frontiers and Conclusions

Dr. Michael J. Havrilla

Dr. Michael J. Havrilla is a Professor of Electrical Engineering at the Air Force Institute of Technology, Wright-Patterson AFB, OH. Dr. Havrilla’s teaching and research interests are in the areas of electromagnetic theory, measurement and applications of anisotropic and bianisotropic media, guided wave and antenna applications and low observable technology. Dr. Havrilla has advised and mentored over 50 graduate students and has published over 150 journal and conference papers. Prior to AFIT, Dr. Havrilla worked in industry for 6 years at General Electric Aircraft Engines, Evendale, Ohio and Lockheed Skunk Works, Palmdale, California. His academic and industrial background has allowed him to bring hands-on education into the classroom and help guide students into areas of applied research that is relevant to the Air Force and measurement community. Dr Havrilla received B.S. degrees in Physics and Mathematics in 1987, the M.S.E.E degree in 1989 and the Ph.D. degree in electrical engineering in 2001 from Michigan State University, East Lansing, MI. He is a member of URSI Commission B, a senior member of the IEEE, a member of AMTA, and a member of the Eta Kappa Nu and Sigma Xi honor societies.

Dr. Lydell L. Frasch

Dr. Lydell L. Frasch is a Technical Fellow of the Boeing Company, St. Louis, Missouri. Dr Frasch’s research interests include the electromagnetic characterization of special materials, such as composites and absorbers, the development of in-field measurement devices for characterizing materials, electromagnetic scattering phenomena with applications in radar cross-section analysis/measurement, and antenna measurement. Before joining Boeing as a senior RCS engineer in 1988, he was a graduate research assistant at Michigan State University. Prior to that he worked for the Dow Chemical Company, Midland Division, Midland, MI, from 1980 to 1983 on in-field, analytical measurement instrumentation. He has been active in the RF/microwave material measurements community for over 28 years and has a long history of academic, industrial and government collaboration. Dr. Frasch received the B.S. degree in physics in 1979 and the B.S. in Electrical Engineering in 1980, both from the South Dakota School of Mines and Technology, Rapid City, South Dakota. He received the M.S. and Ph.D. degrees in electrical engineering from Michigan State University, East Lansing, Michigan, in 1983 and 1987, respectively. Dr. Frasch is a senior member of AMTA, a senior member of the IEEE, a member of ASTM International Committee D9 on electrical insulating materials, Tau Beta Pi, Eta Kappa Nu, Sigma Pi Sigma, and Sigma Xi.

Dr. Peter J. Collins

Dr. Peter J. Collins is a Professor of Electrical Engineering at the Air Force Institute of Technology, Wright-Patterson AFB, OH. Dr. Collins’ research interests are in the areas of low observables, electromagnetic materials design, remote sensing, electromagnetic theory, computational electromagnetics, and signature metrology. Dr. Collins received the B.A. degree from Bethel College, MN and the B.S.E.E. degree from the University of Minnesota, both in 1985, the M.S.E.E. and Ph.D. degrees from the Air Force Institute of Technology, OH in 1990 and 1996 respectively. He is a senior member of the IEEE, a senior member and the immediate past president of the AMTA, and a member of the Eta Kappa Nu and Tau Beta Pi honor societies.

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